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JEDEC JEP106BG   2023  History   STANDARD MANUFACTURERS IDENTIFICATION CODE 50 $
JEDEC JEP114A   2023  History   Guidelines for Particle Impact Noise Detection (PIND) Testing, Operator Training, and Certification 50 $
JEDEC JEP130C   2023  History   Guidelines for Packing and Labeling of Integrated Circuits in Unit Container Packing (Tubes, Trays, and Tape and Reel) 50 $
JEDEC JEP142   2023  History   GUIDELINE FOR OBTAINING AND ACCEPTING MATERIAL FOR USE IN HYBRID/MCM PRODUCTS 50 $
JEDEC JEP146B   2023  History   Guidelines for Supplier Performance Rating 50 $
JEDEC JEP163A   2023  History   SELECTION OF BURN-IN / LIFE TEST CONDITIONS AND CRITICAL PARAMETERS FOR QML MICROCIRCUITS 50 $
JEDEC JEP166E   2023  History   JC-42.6 MANUFACTURER IDENTIFICATION (ID) CODE FOR LOW POWER MEMORIES 50 $
JEDEC JEP183A   2023  History   Guidelines for Measuring the Threshold Voltage (VT) of SiC MOSFETs 50 $
JEDEC JEP192   2023  History   Guidelines for Gate Charge (QG) Test Method for SiC MOSFET 50 $
JEDEC JEP193   2023  History   Survey On Latch-Up Testing Practices and Recommendations for Improvements 50 $